Semiconductor integrated circuit test head



FIG. 1 is a perspective view of a semiconductor integrated circuit test head showing my new design,

FIG. 2 is an end elevation thereof, the opposite end elevation being of corresponding appearance,

FIG. 3 is a side elevation thereof; and,

FIG. 4 is a top plan view thereof. 

The ornamental design for a semiconductor integrated circuit test head, as shown and described. 